Erweiterte Materialcharakterisierung: Grundlagen, neuartige Anwendungen, ein...
160,33 €
Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions, Hardcover by Kumar, Ch Sateesh; Singh, M. Muralidhar; Krishna, Ram, ISBN 1032375108, ISBN-13 9781032375106, Like New Used, Free P&P in the UK Th covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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