Fortschritte in der Optik geladener Partikelanalysatoren: Teil 1 von Peter W. Hawkes hart
363,59 €
By Peter W. Hawkes, Martin Hÿtch. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.
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