Eine Einführung in die Oberflächenanalyse von XPS und AES von John F. Watts (Englisch) Ha
108,02 €
Practical and concise, it includes compositional depth profiling; multi-technique analysis; and everything about samples—including their handling, preparation, stability, and more. Topics discussed in more depth include peak fitting, energy loss background analysis, multi-technique analysis, and multi-technique profiling.
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