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Rasterkraftmikroskopie AFM: Prinzipien, Funktionsweise und Einschränkungen,...

Name: Rasterkraftmikroskopie AFM: Prinzipien, Funktionsweise und Einschränkungen,...
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Atomic Force Microscopy Afm : Principles, Modes of Operation and Limitations, Hardcover by Yang, Hongshun, ., ISBN 1631171720, ISBN-13 9781631171727, Brand New, Free shipping in the US

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