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Atomic Force Microscopy/Scanning Tunneling Microscopy 2 by Samuel H. Cohen (Engl

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Semiconductor Characterization and Adsorbate Characterization. - Scanning Tunneling Microscopy for Very Large-Scale Integration (VLSI) Inspection. - Scanning Tunneling Microscopy of Chemical Vapor Deposition Diamond Film Growth on Highly Oriented Pyrolytic Graphite and Silicon.

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ISBN-13:

9780306455964
ISBN:

9780306455964

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International Standard : tracked-no signature (7 to 15 business days) 48,71 EUR - Lieferung zwischen 14. July 2025 und 21. July 2025 (bei heutigem Zahlungseingang)
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