Rasterkraftmikroskopie: Grundlegende Modi und erweiterte Anwendungen verstehen von
192,89 €
Overview of AFM 1 1.1. The Essence of the Technique 1 1.2. Property Sensitive Imaging: Vertical Touching and Sliding Friction 6 1.3. Modifying a Surface with a Tip 13 1.4. Dynamic (or "AC" or "Tapping") Modes: Delicate Imaging with Property Sensitivity 16 1.5.
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