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C Typ Leeb Härteprüfer Schlaggerät Sonde für kleinere dünne Compone ZfP Neu

Name: C Typ Leeb Härteprüfer Schlaggerät Sonde für kleinere dünne Compone ZfP Neu
Brand: VTSYIQI
SKU: 146673768091
Price: 158.74 EUR
Availability: InStock

158,74 €

Impact device. DL: Test slender narrow groove or hole. Test tip hardness hardness of sample. Hardness 300HV. Test super high hardness material. Hardness 600HV. Hardness 800HV.

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Brand:

VTSYIQI
Type:

DL Type Impact Device Probe
MPN:

Impact Device Probe
Country/Region of Manufacture:

China

Economy Shipping:

Economy Shipping from Greater China to worldwide 10,08 EUR - Lieferung zwischen 08. September 2025 und 22. September 2025 (bei heutigem Zahlungseingang)
Expedited shipping:

Expedited Shipping from Greater China to worldwide 40,69 EUR - Lieferung zwischen 18. August 2025 und 26. August 2025 (bei heutigem Zahlungseingang)
Versand nach:

Weltweit
Versand ausgeschlossen:

Afrika , Bahrain , Irak , Jordanien , Kuwait , Libanon , Jemen , Anguilla , Antigua und Barbuda , Aruba , ... und weitere

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