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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits by Manoj Sachdev (Eng

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By Manoj Sachdev, José Pineda de Gyvez. Manoj Sachdev has (co)authored several books for Springer/Kluwer. Step-by-step handling of defect modeling, defect-oriented testing, yield modeling and its usage in common economics practices enables deeper understanding of concepts.

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ISBN-13:

9781441942852
Book Title:

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN:

9781441942852

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