Integrated Circuit Defect-Sensitivity: Theory and Computational Models by Jos? P
122,18 €
1 Introduction. - 1.1 Approaches to Yield Modeling. - 2 Defect Semantics and Yield Modeling. - 2.1 Microelectronics Technology. - 2.2 Modeling of Process Induced Defects and Faults. - 2.3 Statistical Characterization of Spot Defects.
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