Grenzflächenkompatibilität in der Mikroelektronik: Weg vom Test an...
172,56 €
Interfacial Compatibility in Microelectronics : Moving Away from the Trial and Error Approach, Hardcover by Laurila, Tomi; Vuorinen, Vesa; Mattila, Toni T.; Turunen, Markus; Palausto-krockel, Mervi, ISBN 1447124693, ISBN-13 9781447124696, Like New Used, Free shipping in the US This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.
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