Jeep JSM-6300F SEM Rasterelektronenmikroskop Säulenbaugruppe funktionstüchtig Überschuss
3.453,10 €
Removed from a JEOL JSM-6300F SEM Scanning Electron Microscope System. Model No: JSM-6300F Column. This item is working surplus. The physical condition is good, but there are signs of previous use and handling.
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