Lifetime Reliability-aware Design of Integrated Circuits Behnam Ghavami
90,94 €
Titel: Lifetime Reliability-aware Design of Integrated Circuits, Einband: Taschenbuch, Autor: Behnam Ghavami, Verlag: Springer International Publishing, Springer Nature Switzerland, Sprache: Englisch, Seiten: 124, Maße: 235x155x8 mm, Gewicht: 201 g, Verkäufer: buch-mimpf, Schlagworte: Ageing of Integrated Circuits Reliability Analysis of Flip-Flops Reliability of Nanometer VLSI Systems reliability of digital systems reliability of nano-scale CMOS digital circuits.
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