LPCVD Silicon Nitride and Oxynitride Films: Material and Applications in Integra
67,03 €
1 Characterization of LPCVD Silicon Oxynitride Films. - I. Introduction. Characterization Techniques. Results and Discussion. Concluding Remark. - 3 Oxidation of Low Pressure Chemical Vapour Deposited Silicon Oxynitride Films.
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