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Maschinelles Lernen Unterstützung für Fehlerdiagnose von System-on-Chip von Patrick Girard

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This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification.

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EAN:

9783031196386
UPC:

9783031196386
ISBN:

9783031196386
Format:

Hardback, 316 pages, 2023 Edition
Author:

Patrick Girard (Edited by)
Book Title:

Machine Learning Support for Fault Diagnosis of Sy
Item Height:

1.9 cm
Item Length:

23.4 cm
Item Weight:

0.66 kg
Item Width:

15.6 cm
Language:

Eng
Publisher:

Springer International Publishing AG

Expressversand:

International Priority Shipping 13,44 EUR - Lieferung zwischen 30. July 2025 und 01. August 2025 (bei heutigem Zahlungseingang)
Versand nach:

Großbritannien, Österreich, Belgien, Bulgarien, Republik Kroatien, Zypern, Tschechische Republik, Dänemark, Estland, Finnland, Frankreich, Deutschland, Griechenland, Ungarn, Irland, Italien, Lettland, Litauen, Luxemburg, Malta, Niederlande, Polen, Portugal, Rumänien, Slowakei, Slowenien, Schweden, Australien, USA, Bahrain, Kanada, Brasilien, Japan, Neuseeland, China, Hongkong, Norwegen, Mexiko, Singapur, Südkorea, Schweiz, Taiwan, Bangladesch, Belize, Bermuda, Bolivien, Barbados, Brunei Darussalam, Kaimaninseln, Dominica, Ecuador, Ägypten, Guernsey, Gibraltar, Guadeloupe, Grenada, Französisch-Guayana, Island, Jersey, Jordanien, Kambodscha, St. Kitts und Nevis, St. Lucia, Liechtenstein, Sri Lanka, Macau, Monaco, Malediven, Montserrat, Martinique, Nicaragua, Oman, Pakistan, Peru, Paraguay, Réunion, Turks- und Caicosinseln, Saudi-Arabien, Südafrika, Vereinigte Arabische Emirate, Ukraine, Chile, Kolumbien, Costa Rica, Dominikanische Republik, Guatemala, Honduras, Jamaika, Kuwait, Panama, Philippinen, Katar, El Salvador, Trinidad und Tobago, , Vietnam
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