Nanometer-scale Defect Detection Using Polarized Light by Philippe Pougnet (Engl
182,53 €
By Philippe Pougnet, Pierre-Richard Dahoo, Abdelkhalak El Hami. Preface xi Chapter 1. Uncertainties 1 1.1. Introduction 1 1.2. The reliability based design approach 2 1.2.1. Principle 9 1.3.2. The set approach 14 1.4.1.
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