Semiconductor Modeling Using Relxpert and Design of Experiments by Mike Peralta
11,86 €
RELIABILITY MODELING USING RELXPERT. In this monograph we cover the following DOE's and use conditions such as ID, VDG, and L are used to fully model the use condition range.
Jetzt bei Ebay:
![Produktbild - Experiments With Vacuum Tubes by Salomons [Paperback]](https://i.ebayimg.com/thumbs/images/g/6t0AAeSwhXtoKhIW/s-l140.jpg)
