Test Pattern Generation using Boolean Proof Engines by Rolf Drechsler (English)
123,72 €
By Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Daniel Tille. After producing a chip, the functional correctness of the integrated circuit has to be checked. Many algorithms for "Automatic Test Pattern Generation" (ATPG) have been proposed in the last 30 years.
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