Testability Concepts for Digital ICs: The Macro Test Approach by F.P.M. Beenker
164,10 €
By F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen. 1 Introduction. - 1.1 The Main Topic. - 1.2 Test Objectives. - 1.3 Definition of Testability. - 1.5 Outline. - 2 Defect-Oriented Testing. - 2.1 Reason.
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