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Prüfung auf Defekte mit geringer Verzögerung in integrierten CMOS-Schaltungen im Nanoskaligen

Name: Prüfung auf Defekte mit geringer Verzögerung in integrierten CMOS-Schaltungen im Nanoskaligen
SKU: 167523154188
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EAN:

9781138075771
UPC:

9781138075771
ISBN:

9781138075771
Book Title:

Testing for Small-Delay Defects in Nanoscale CMOS
Item Length:

23.4 cm

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International Priority Shipping 13,45 EUR - Lieferung zwischen 22. July 2025 und 24. July 2025 (bei heutigem Zahlungseingang)
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Prüfung auf Defekte mit geringer Verzögerung in integrierten CMOS-Schaltungen im Nanoskaligen

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Paperb...

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Paperb...

Testing for Small-Delay Defects in Nanoscale CMOS Integ - Paperback NEW Goel, Sa

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Hardco...

Cmos Digital Integrated Circuits:Analysis and Design, Sung-Mo Kang Leblebici中文版

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Hardco...

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Hardco...

Testing for Small-Delay Defects in Nanoscale CMOS

Testing for Small-delay Defects in Nanoscale Cmos Integrated Circuits, Hardco...

Design of Analog Cmos Integrated Circuits, Paperback by Razavi, Behzad, Like ...

Low-Power High-Level Synthesis for Nanoscale CMOS Circuits by Nagarajan...

Cmos Millimeter-Wave Integrated Circuits for Next Generation Wireless Communi...

Low-Power High-Level Synthesis for Nanoscale CMOS Circuits - 9781441945549

Physical Design of CMOS Integrated Circuits Using L-Edit

CMOS Nanoelectronics Analog RF VLSI Circuits Iniewski Nanoscale Design BK1480

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - 9781441942852

Physical Design of CMOS Integrated Circuits Using L

Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools [Hardback]

High-Speed Optical Receivers with Integrated Photodiode in Nanoscale CMOS: New

Carbon-Based Electronics: Transistors and Interconnects at the Nanoscale by Asho

Prüfung auf Defekte mit geringer Verzögerung in integrierten CMOS-Schaltungen im Nanoskaligen

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