An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and
134,72 €
While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties. While providing a brief overview of the principles of SIMS, the book also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
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