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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Ch

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100,18 €

Subtitle Applications for Depth Profiling and Surface Characterization. Audience Professional & Vocational. This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained.

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ISBN-13:

9781606505885
Book Title:

Secondary Ion Mass Spectrometry
ISBN:

9781606505885

None:

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