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Assessment and Application of Defect Characterization via Lifetime Spectroscopy

Name: Assessment and Application of Defect Characterization via Lifetime Spectroscopy
Brand: Fraunhofer Verlag
SKU: 396658638641
Price: 84.00 EUR
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Titel: Assessment and Application of Defect Characterization via Lifetime Spectroscopy in High Purity C-Si., Einband: Taschenbuch, Autor: Regina Post, Verlag: Fraunhofer Verlag, Sprache: Englisch, Seiten: 172, Maße: 205x145x11 mm, Gewicht: 246 g, Verkäufer: buch-stadl, Schlagworte: Fotovoltaik Photovoltaik Solartechnik / Fotovoltaik Körper (physikalisch) / Festkörper Umwelt / Technik TECHNOLOGY & ENGINEERING / Environmental / General Photovoltaics Semiconductor Physics Gallium Doping Carrier Lifetime Ingenieure, Forscher, Wissenschaftler.

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Verlag:

Fraunhofer Verlag
Autor:

Regina Post
Seiten:

172
Gewicht:

246
Einband:

Taschenbuch
Format:

205x145x11 mm
Sprache:

Englisch
Marke:

Fraunhofer Verlag
Fachbereich:

Hardcover/Naturwissenschaften, Medizin, Informatik, Technik/Te...
Publikationstitel:

Assessment and Application of Defect Characterization via Life...
Erscheinungsjahr:

20230622
Produktart:

Bücher
Buchtitel:

Assessment and Application of Defect Characterization via Life...
Untertitel:

Keine Angabe
Film-/Fernseh-Titel:

Keine Angabe
Publikationsname:

Assessment and Application of Defect Characterization via Life...
Musiktitel:

Keine Angabe
Interpret:

Keine Angabe
Schlagworte:

Fotovoltaik Photovoltaik Solartechnik / Fotovoltaik Körper ...
ISBN:

9783839619179

Standardversand:

DHL Paket kostenlos - Lieferung zwischen 30. June 2025 und 02. July 2025 (bei heutigem Zahlungseingang)
Versand nach:

Deutschland
Versand ausgeschlossen:

Afrika , Asien , Mittelamerika und Karibik , Dänemark , Schweiz , Vatikan , Moldawien , Republik Kroatien , Portugal , Malta , ... und weitere

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