Elektronen- und Ionenmikroskopie und Mikroanalyse: Prinzipien und Anwendungen, ...
Electron and Ion Microscopy and Microanalysis : Principles and Applications, Hardcover by Murr, Lawrence Eugene, ISBN 0824785568, ISBN-13 9780824785567, Like New Used, Free shipping in the US The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math background equivalent to sophomore-level science or engineering courses, including differential equations and matrix algebra. Quantum mechanics is not assumed. Produced from double-spaced typescript. Annotation copyright Book News, Inc. Portland, Or.
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