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Elektronen- und Ionenmikroskopie und Mikroanalyse: Prinzipien und Anwendungen, ...

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Electron and Ion Microscopy and Microanalysis : Principles and Applications, Hardcover by Murr, Lawrence Eugene, ISBN 0824785568, ISBN-13 9780824785567, Like New Used, Free P&P in the UK The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math background equivalent to sophomore-level science or engineering courses, including differential equations and matrix algebra. Quantum mechanics is not assumed. Produced from double-spaced typescript. Annotation copyright Book News, Inc. Portland, Or.

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