Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characteri
194,79 €
Kelvin Probe Force Microscopy. Part I: Technical aspects. - Dissipation KPFM. - Open-loop and excitation KPFM. - Quantitative KPFM on semiconductor devices. - KPFM with atomic resolution. - Part II: Theoretical Aspects.
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