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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Stan

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While many techniques have investigated power minimization during the functional (normal) mode of operation, it is important to examine the power dissipation during the test circuit activity is substantially higher during test than during functional operation.

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ISBN-13:

9781441953155
Book Title:

Power-Constrained Testing of VLSI Circuits
ISBN:

9781441953155

None:

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