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Test Generation of Crosstalk Delay Faults in VLSI Circuits by S. Jayanthy (Engli

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Prof. Jayanthy's research interests are in VLSI Design & Testing, Genetic Algorithms and Embedded Systems. by S. Jayanthy, M.C. Bhuvaneswari. This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits.

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ISBN-13:

9789811347849
Book Title:

Test Generation of Crosstalk Delay Faults in VLSI Circuits
ISBN:

9789811347849

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