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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy by W

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Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits. The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection.

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ISBN-13:

9780471492405
Book Title:

Semiconductor Device and Failure Analysis
ISBN:

9780471492405

None:

International Standard : tracked-no signature (7 to 15 business days) 21,68 EUR - Lieferung zwischen 26. June 2025 und 07. July 2025 (bei heutigem Zahlungseingang)
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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy by W

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