Ertrags- und Variabilitätsoptimierung integrierter Schaltungen, Hardcover von Zhang...
Yield and Variability Optimization of Integrated Circuits, Hardcover by Zhang, J. C.; Styblinski, M. A., ISBN 0792395514, ISBN-13 9780792395515, Brand New, Free shipping in the US An introductory reference on statistical design methods for practicing designers of integrated circuits. Describes a spectrum of associated problems such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. Among the other topics are the design of experiments and factor screening, some basic tenets of fuzzy set theory and multi-objective statistical optimization. Includes examples illustrating the application of the various methods. Annotation copyright Book News, Inc. Portland, Or.
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