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Logic Testing and Design for Testability; Mit Press Series in Computer Systems;

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MIT Press 1985. 284 Seiten; gebundene Ausgabe Sprache: Englisch ISBN: 0262060965 EAN: 9780262060967 Bestell-Nr: 2040410 Bemerkungen: Der Erhaltungszustand des hier angebotenen Werks ist trotz seiner Bibliotheksnutzung sauber. Es befindet sich neben dem Rückenschild lediglich ein Bibliotheksstempel im Buch; ordnungsgemäß entwidmet. In ENGLISCHER Sprache. .

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EAN:

9780262060967
ISBN:

0262060965
Verlag:

MIT Press
Erscheinungsjahr:

1985
Autor:

Fujiwara, Hideo
Publikationsname:

Logic Testing and Design for Testability
Sprache:

Englisch
Format:

gebundene Ausgabe
Produktart:

Bücher

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