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LSI/VLSI Testability Design. Tsui, Frank F.

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McGraw-Hill New York 1986. 701 S. Paperback/ broschiert broschiert/ Taschenbuch Sprache: Englisch ISBN: 0070653410 EAN: 9780070653412 Bestell-Nr: 465085 Bemerkungen: Sehr guter Zustand/ very good Ex-Library. With ill. Schlagworte: Integrated circuits Large scale integration Testing Very large scale integration .

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EAN:

9780070653412
ISBN:

0070653410
Verlag:

McGraw-Hill New York
Erscheinungsjahr:

1986
Autor:

Tsui, Frank F
Publikationsname:

LSI/VLSI Testability Design
Sprache:

Englisch
Format:

Paperback/ broschiert
Produktart:

Bücher

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