VLSI Design and Test Ambika Prasad Shah
Titel: VLSI Design and Test, Untertitel: 26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers, Einband: Taschenbuch, Autor: Ambika Prasad Shah, Verlag: Springer Nature Switzerland, Springer International Publishing, Sprache: Englisch, Seiten: 616, Maße: 235x155x33 mm, Gewicht: 920 g, Verkäufer: buch-mimpf, Schlagworte: Computer Hardware Computer Systems Computer vision Engineering Field Programmable Gate Array (FPGA) Microprocessor chips Signal Processing Signal to Noise Ratio Telecommunication networks Telecommunication traffic VLSI circuits bandwidth communication channels (information theory) communication systems computer networks computer-aided design (CAD) mathematics network protocols telecommunication systems wireless telecommunication systems.
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